{"created":"2025-10-22T02:33:14.912183+00:00","id":2001906,"links":{},"metadata":{"_buckets":{"deposit":"4f6b0ac9-9b40-4027-b04e-f92a2500dad6"},"_deposit":{"created_by":5,"id":"2001906","owner":"5","owners":[5],"pid":{"revision_id":0,"type":"depid","value":"2001906"},"status":"published"},"_oai":{"id":"oai:fukuoka-edu.repo.nii.ac.jp:02001906","sets":["71:84:1759976870866"]},"author_link":["11457"],"item_12_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2025-03-21","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"15","bibliographicPageEnd":"382","bibliographicPageStart":"377","bibliographic_titles":[{"bibliographic_title":"福岡教育大学大学院教育学研究科教職実践専攻(教職大学院)年報","bibliographic_titleLang":"ja"},{"bibliographic_title":"Bulletin of University of Teacher Education Fukuoka Graduate School of Education Division of Professional Practice in Education","bibliographic_titleLang":"en"}]}]},"item_12_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"子どもが教室で学習する際に，一時的な記憶の働きであるワーキングメモリは重要な役割を果たす。近年の研究でワーキングメモリに弱さのある子どもでは教室での授業参加が難しくなる場合があることや，限局性学習症のある子どもにおいてワーキングメモリの弱さのあることが明らかになっている。ワーキングメモリの困難や発達障害のある子どもに対して適切な支援を行うため，アセスメントとしてワーキングメモリのテストバッテリであるWMTB-CやAWMA，HUCRoW，CABC-WMなどが開発されてきた。これらのテストバッテリはそれぞれ異なる理論的基盤や構成要素に基づいて構成されている。本稿ではこうしたテストバッテリの現状について述べ，ワーキングメモリのアセスメントについての基礎的な知見を概括することを目的とする。","subitem_description_language":"ja","subitem_description_type":"Abstract"}]},"item_12_publisher_18":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"福岡教育大学大学院教育学研究科教職実践専攻"}]},"item_12_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2435-5410","subitem_source_identifier_type":"EISSN"}]},"item_12_version_type_13":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_1760598540895":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","date":[{"dateType":"Available","dateValue":"2025-10-22"}],"filename":"15_377-382.pdf","filesize":[{"value":"1 MB"}],"format":"application/pdf","url":{"url":"https://fukuoka-edu.repo.nii.ac.jp/record/2001906/files/15_377-382.pdf"},"version_id":"f9f777df-d937-4b6c-91f0-88f3f2007ad1"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"河村, 暁","creatorNameLang":"ja"},{"creatorName":"カワムラ, サトル","creatorNameLang":"ja-Kana"},{"creatorName":"KAWAMURA, Satoru","creatorNameLang":"en"}],"familyNames":[{"familyName":"河村","familyNameLang":"ja"},{"familyName":"カワムラ","familyNameLang":"ja-Kana"},{"familyName":"KAWAMURA","familyNameLang":"en"}],"givenNames":[{"givenName":"暁","givenNameLang":"ja"},{"givenName":"サトル","givenNameLang":"ja-Kana"},{"givenName":"Satoru","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"11457","nameIdentifierScheme":"WEKO"}]}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"ワーキングメモリ，テストバッテリ，学習到達度，支援","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"ワーキングメモリのテストバッテリの現状","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"ワーキングメモリのテストバッテリの現状","subitem_title_language":"ja"},{"subitem_title":"ワーキング メモリ ノ テスト バッテリ ノ ゲンジョウ","subitem_title_language":"ja-Kana"},{"subitem_title":"Current status of working memory test batteries","subitem_title_language":"en"}]},"item_type_id":"12","owner":"5","path":["1759976870866"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2025-10-22"},"publish_date":"2025-10-22","publish_status":"0","recid":"2001906","relation_version_is_last":true,"title":["ワーキングメモリのテストバッテリの現状"],"weko_creator_id":"5","weko_shared_id":-1},"updated":"2025-10-22T02:42:29.889746+00:00"}